Pitch 1 - UNVEIL : Simultaneous size and mass characterization of any 20–300 nm nanoparticle — from empty/full AAV discrimination to LNP profiling
Apr 16, 2026 — 12:05 pm - 12:10 PMAuditorium Descartes
Description
Presentation of a new label-free technology for characterizing 20-3000nm nanoparticles (concentration, size, and mass)


